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Description:
The specular reflection accessory can measure the reflectance spectrum of optical surfaces, crystals and coated samples. Incidence angle: 5°
Measured sample area: 11×9mm to 60×40mm
Wavelength range: 200-1100nm
Thickness: <10mm
Description:
The specular reflection accessory can measure the reflectance spectrum of optical surfaces, crystals and coated samples. Incidence angle: 5°
Measured sample area: 11×9mm to 60×40mm
Wavelength range: 200-1100nm
Thickness: <10mm
Documentation about the products will be supplied by return email if you leave your email address.
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